PATEL, Nirmala Parixit. Data Migration Excellence in SAP S/4HANA: A Framework for Zero-Defect Cutover. International Journal of Scientific Research and Modern Technology, India, v. 3, n. 11, p. 236–242, 2024. DOI: 10.38124/ijsrmt.v3i11.1597. Disponível em: https://www.ijsrmt.com/index.php/ijsrmt/article/view/1597. Acesso em: 10 aug. 2026.