Patel, Nirmala Parixit. “Data Migration Excellence in SAP S 4HANA: A Framework for Zero-Defect Cutover”. International Journal of Scientific Research and Modern Technology 3, no. 11 (November 28, 2024): 236–242. Accessed August 10, 2026. https://www.ijsrmt.com/index.php/ijsrmt/article/view/1597.